Autonomous Built-in Self-Test Methods for SRAM Based FPGAs
نویسنده
چکیده
Built-in Self-Test (BIST) approaches for Static Random Access Memory (SRAM) based Field Programmable Gate Arrays (FPGAs) must be capable of fully testing the resources in the device. A summary of current techniques is presented in this paper that covers the three main components of modern FPGAs: logic blocks, interconnects and embedded FPGA cores. Overhead requirements, coverage capability, transient detection and BIST evaluation times are evaluated for each approach.
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.......................................................................................................................................... ii Acknowledgments.......................................................................................................................... iv List of Tables ......................................................................................................
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تاریخ انتشار 2015